Metrology: Inpection & Characterisation

	Physico-Chemical and Spectroscopic Study of AlN Powder as a High-Tech Material for Microelectronics Dielectric Substrates I. Markova-Deneva, T. Petrov and I. Denev
	Optical Coherence Tomography – A Potential Tool for Roughness Assessment of Free and Embedded Surfaces of Laser-Machined Alumina Ceramic R. Su, M. Kirillin, D. Jurków, K. Malecha, L. Golonka and L. Mattsson
	Micro-Stamping of PEMFC Bipolar Plates-Investigations on the Effect Coating and Surface Quality Interactions on the Corrosion Resistance Characteristics of Micro-Channeled Metallic Surface Areas M. F. Peker, Ö. N. Cora and M. Koç
	Monitoring Method for Carbon Nanotubes (CNT): Personal Sampler and Corresponding Reading Device M. Keller, G. Kreck, Y. Holzapfel, N. Neubauer and M. Seipenbusch