Characterisation & Metrology


Session TitleCharacterisation & Metrology

Tolerance Verification of an Industrial Assembly Using Computed Tomography
Alessandro Stolfi, Leonardo De Chiffre and Francesco Regi

Comparison of Scatterometry, Imaging Scatterometry, AFM and Confocal Microscopy
M. H. Madsen, J. S. Madsen, P. E. Hansen, P. Boher, J. Nygård, D. Dwarakanath and J. F. J 0rgensen

Towards Real Time Effective Dimensional Verification of High Throughput Nano-Embossing Manufacturing
M. Calaon, P.Chamberlain, M.H. Madsen, D. Hardt, G. Tosello and H.N. Hansen

Investigation on the Micromilled Surface Characterization Through Replica Technology
F. Baruffi, P. Parenti, F. Cacciatore, M. Annoni and G. Tosello

Correction of Systematic Behaviour in Topographical Surface Analysis
D. Quagliotti, F. Baruffi, G. Tosello, S. Gasparin, M. Annoni, P. Parenti, R. Sobiecki and H. N. Hansen