Proceedings of the
9th International Conference of Nanomanufacturing (nanoMan2024)
December 1 – 4, 2024, Singapore
Fundamental Theory of Non-Uniform Residual Tool Marks in Ultra-Precision Diamond End-Flycutting
State Key Laboratory of Ultra-precision Machining Technology, Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong SAR, People's Republic of China.
ABSTRACT
Residual tool marks (RTMs) in diamond cutting critically affect the quality of machined nanosurfaces. Traditionally, researchers assume that planar machining results a flat due to the uniformity of RTMs. In this study, we verify the phenomenon of non-uniform RTMs in diamond end-flycutting and elucidate the factors contributing to the non-uniformity. We developed an evolutionary model to trace the impact of position-induced RTMs on final surface characteristics, which was validated through experiments. Our findings challenge the conventional assumption of planar machining when using end-flycutting method, revealing that the machined surface actually resemble a symmetrical curved surface—higher at the center and lower at the edges. This curved surface introduces a new positional controlling parameter not only for nanosurface machining, but also for microstructure fabricating in diamond end-flycutting. This study documents non-uniform surfaces in ultra-precision end-flycutting and first introduce the position parameter, providing guidance for researchers to re-evaluate the reliability and precision of their experimental results.
Keywords: Diamond cutting, End-flycutting, Residual tool mark, Modelling, Microstructure.
