Proceedings of the

The 33rd European Safety and Reliability Conference (ESREL 2023)
3 – 8 September 2023, Southampton, UK

An All-Digital Hardware Monitoring System at Run-Time to Improve the Reliability of Electronic Devices

Leonardo Fazzinia, Luigi Pomanteb and Marco Santicc

Università degli Studi dell'Aquila - DISIM/DEWS, Italy.

ABSTRACT

This paper describes a use case developed in the context of a European research project. The main goal of such a use case is to show as it has been possible to exploit an all-digital hardware monitoring system at run-time to improve reliability with focus on verification activities. For such a purpose, a pacemaker has been developed in two versions. One version has been based on a Commercial Off-The-Shelf microcontroller, where some properties have been verified by means of a classical offline traces analysis approach. The other version has been based on a soft-core on Field Programmable Gate Array, where the same properties have been verified at run-time by means of the adopted all-digital hardware monitoring system. The comparison of the two verification approaches shows how it is possible (i) to reduce the time needed to perform verification and (ii) to provide the opportunity to verify more complex properties with respect to classical Built-In Self-Test approaches.

Keywords: Embedded systems, Monitoring systems, Reliability, Verification, Microcontroller, FPGA.



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