Proceedings of the

The 33rd European Safety and Reliability Conference (ESREL 2023)
3 – 8 September 2023, Southampton, UK

Optimization of Step-stress ADT following Tweedie Exponential Dispersion Process

Weian Yan1,a, David Bigaud2, Xiaofan Xu1 and Wenqin Cao1

1School of Transportation Engineering, East China Jiaotong University, Nanchang, 330013, Jiangxi, China.

2Univ Angers, LARIS, SFR MATHSTIC, F-49000 Angers, France.


In this study, we focus on the optimization of step-stress accelerated degradation test (SSADT) plan when the degradation process can be modelled by a stochastic Tweedie exponential dispersion (TED) process. In the context of an optimization based on the D-optimality and V-optimality criteria, with a prior transformation of stress, the equivalence between a multilevel SSADT plan and a simple SSADT plan using only the minimum and maximum stress levels can be shown. Thus optimal SSADT plans can be simply derived. An application example will be presented to assess the effectiveness of the proposed simple optimal SSADT plans.

Keywords: Accelerated degradation test, Optimization, Tweedie exponential dispersion process.

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