Proceedings of the
9th International Conference of Asian Society for Precision Engineering and Nanotechnology (ASPEN2022)
15 – 18 November 2022, Singapore

Laterally Differential Interference Microscopy to Observe Phase oObjects

Jinhee Cho1, and Ki-Nam Joo1,a

1Dept. of Photonic Engineering, Chosun University, 309 Pilmun-daero, Dong-gu, Gwangju, 61452, South Korea


In this investigation, we propose a laterally differential interference microscopy to be compact and enable a snapshot measurement. The proposed microscopy adopts the lateral shearing interferometric principle, which can obtain the lateral slope of the measurement wave from the self-interference without the reference. Due to the absence of the reference, the system is more stable than the typical interferometric systems. It uses a polarization grating to generate two laterally shifted wavefronts, which makes the system more compact and reliable, because of its birefringent, polarizing beam splitting characteristics. Furthermore, the use of a polarization camera does not require sequential measurements for the phase extraction. In the experiments, we observed and measured the temporal changes of various specimens to verify the system performance. Because the proposed microscopy also has the benefit to be adaptable to the typical microscopy system instead of using an imaging camera, it can be replaced with the conventional contrast microscopy.

Keywords: Laterally differential interference microscopy, Polarization grating, Phase imaging

PDF Download