Proceedings of the
9th International Conference of Asian Society for Precision Engineering and Nanotechnology (ASPEN2022)
15 – 18 November 2022, Singapore

Metrology Applications in In-Situ Process Monitoring of Additive Manufacturing

Baoxi Xu1,a, Yuanjie Liu1, Li Wang1, Shengkai Yu1, Chengwu An1, Jing Zhang1, Shaochun Ye1, Yan Fan1, Jie Fang1, Alvin Kuang Shuan Tan2, Chee Kit Choy2 and Youxiang Chew2

1National Metrology Centre, Agency for Science, Technology and Research (A*STAR), 8 CleanTech Loop, #01-20, Singapore 637145 Singapore

2Singapore Institute of Manufacturing Technology, Agency for Science, Technology and Research (A*STAR), 2 Fusionopolis Way, Singapore 138634 Singapore


In this presentation, the status of metrology applications and standard developments in AM will be reviewed briefly first. The focus will be on metrology in the in-situ melt pool monitoring. The measurement principles of the different melt pool monitoring methods will be introduced. The applicable calibration methods, and advantages and disadvantages for them to be used for the AM process close loop control will be analyzed.
A system for the in-situ melt pool temperature distribution measurement and process close loop control has been developed with measuring the melt pool parameters in real time for the direct energy deposition (DED) AM at hundreds of frames per second. The real system calibrations in temperature and dimension will be illustrated and the results will be discussed. Finally, the experiments of adaptive feedback close loop controls for the different melt pool parameters with a DED AM machine will be demonstrated, and the results indicates that the close loop control can keep the controlled parameter in constant vert well. Compared to the printing without close loop control, the printing performance with the close loop control system has been improved significantly

Keywords: Metrology, Additive Manufacturing, In-Situ Melt Pool Monitoring, Direct Energy Deposition.

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