With the development of modern electronic technology, especially embedded technology, software and hardware collaborative design technology, more and more products are designed by software and hardware hybrid based on general or special computing platform. The level of scale, digitization and automation of weapons and equipment has been continuously improved, and the scale and complexity of equipment have increased dramatically. Most of the current research is to consider software reliability and hardware reliability separately, and rarely consider the difference between the two parts. However, in hard-software integrated systems, hardware and software interact with each other. In order to better solve the reliability problem caused by the hard-software system in use. This paper firstly establishes the time series relationship model between the interaction of each component and the interaction of various components with various environmental stresses. And then uses GTS (the Guarded Transition System) timing and timing random mixture to generate formal model of the above relationship and reliability test conditions. Finally, The Monte Carlo constrained solution method is used to obtain the comprehensive test profiles of environmental stress, electromagnetic stress and software operating stress. The hard-software systems reliability profile method proposed in this paper can reflect the actual use of typical products more realistically. This paper also uses typical hard-software system to verify the feasibility and effectiveness of the method.