Conducting a reliability-exploitation analysis of electronic devices (including those used in communication systems), it can be concluded that they operate in diverse, often extreme conditions. Being in a state of capability depends not only on the reliability of subsystems that create them, but also on the rational management of their exploitation. During analyses, it is important to take into account the susceptibility and resistance of electronic devices to the impact of strong electromagnetic pulses. Therefore, determining the safety levels of electronic devices exposed to strong electromagnetic pulses is justified. This will allow you to apply solutions (eg constructional, organizational) that will increase the probability of being in a state of ability. The study presents a reliability and exploitation analysis of an electronic device that is used in an object exposed to strong electromagnetic pulses. It made it possible to propose a graph of relations in the considered system, and then to create a set of Kolmogorov-Chapman equations describing it. On this basis, it is possible to determine the dependencies allowing to calculate the probabilities of the system being in states: full capability, safety emergency and safety unreliability. In further research, it is planned to increase the number of safety emergency states in order to more accurately reflect the impact of various types of solutions reducing the effects of strong electromagnetic pulses on an electronic device.