Reliability of an electronic component or system can be determined from the failure data using many techniques. These reliability techniques are broadly classified into two categories parametric method and non-parametric method. In the parametric method, we calculate the reliability of items and failure rate based on the simple mathematical relationships. It is desirable to fit the failure data to any statistical distribution, such as the Weibull, exponential, normal, and lognormal. This will result in a better understanding of the failure mechanisms, and the resulting model helps to evaluate the reliability parameters for the whole lifespan of the system analytically. The non-parametric method are not concerned about the type of distribution of failure data and it is generally used for obtaining initial rough estimates of the reliability characteristics. Accelerated life testing (ALT) and highly accelerated life testing (HALT) are the two reliability testing method to test the passive components like capacitors, resistors and PCBs under accelerated condition. The accelerated life testing is used to reduce the testing times of the electronic devices. The engineers are searching for the reliability method to determine the Time-to-failure (TTF) of the electronic devices. In this paper, parametric method is used to determine the reliability of the widely used X7R and C0G nano ceramic capacitors and the failure rate of the capacitor by using statistical distribution. The phenomenon rating (temperature and voltage) of nano ceramic capacitors reduces the risk based on the reliability models.

Keywords: Nano ceramic Capacitors, Accelerated Life Testing (ALT), Highly Accelerated Life Testing (HALT), Mean Time to Failure (MTTF), Parametric method, Reliability, Time to Failure (TTF).