doi: 10.3850/978-981-11-0749-8_685
Experimental Verification of Drop Impact Test and Analysis for Mobile Electronics
Byungjoo Choi, Hyunho Yeom, Yong-Ho Jeon and Moon G. Lee
Department of Mechanical engineering, Ajou University, Republic of Korea
Abstract
Mobile electronics industry is attempting to reduce the size and weight, because of the growing needs for ease of handling. According to this trend, concerns about the durability are also getting increased. For this reason, this study includes the impact test and analysis for a mock-up mobile phone by using a newly designed drop impact tester. The primary focus of the test is on the freefall and desired impact direction by the drop assisting apparatus. The comparison of the assisted drop with the freefall was conducted to confirm the little difference by the pre-test. And the repeatability was investigated for the impact of the correct location and direction in repeated experiments. The high speed camera was also used to monitor the impact behaviour and to record the displacement for velocity measurement. Then, mock-up mobile phone was measured as a result of preliminary research in order to analyse the behaviour of the actual smartphone in next study. Moreover, impact analysis at the same model and conditions of test was conducted to compare the relationship between the test and the finite element model. The analysis and test demonstrated that the analytical contact-impact force was similar to test results. Consequently, reliability of drop impact test and analytical model was investigated by experimental verification, and it could be utilized for development of new mobile electronics in the future.
Keywords: Mobile electronics, Impact test, Impact analysis.
